Notark A

Notark A Series Resin Additives

Notark A series resins are specialized additive resins developed to improve peel strength and adhesion
performance in PCB and IC substrate applications.  Notark A series resins provide critical reinforcement
to copper-clad materials and various inorganic fillers, ensuring superior reliability.

Notark Resins

Notark A Series Performance Attributes

01

Enhanced Peel Strength (PS)

Strengthens copper foil adhesion for improved durability.

02

Eliminates Macro-Phase Separation

Ensures uniform physical properties across the entire insulation composite of resin matrix and inorganic fillers.

03

Excellent Processability

Works efficiently with standard PCB and IC packaging manufacturing.

04

Thermal Stability

Optimized for High-End Substrates – Perfect for buildup films and ultra-low loss dielectric applications.

05

Superior Modulus

Provides excellent mechanical strength.

06

Exceptional Compatibility

Works seamlessly with high-end CCL materials like NER, NEZ, Q-cloth, silica filler, and beyond. Halogen- and oxygen-free to meet any regulatory requirements.

The Notark A2000 Advantage

Notark A2000 enhances peel strength when blended with Notark R2000, across various copper foils. Similar benefits are observed in PPE resin systems.

Cu Foil Ra (µm) Rz (µm) Relative Peel Strength – Notark R2000 only Relative Peel Strength – Notark A2000 @ 5 wt% loading
A 0.83 7.15 100 150 ± 5
B 0.26 3.99 100 160 ± 5
C 0.30 3.96 100 205 ± 10
D 0.15 2.06 100 142 ± 5

* Lamination conditions: Curing temperature = 220°C, Pressure = 10 MPa, Curing time = 60 min; Peel Strength was measured as per IPC TM-650 2.4.9 (½” wide, 90° angle at 2 inch/min).

Typical Notark A Properties

Analysis Parameter Unit Typical Value
Total Solids % 20 – 40
Viscosity, Brookfield @ 25 °C (18 SS) cPs 500 – 5 000
Grit (Retained on 2485 mesh / 5 µm) ppm < 30
Moisture (Coulometric KF) ppm < 20
Color Appearance (Hunter Gardner) < 0.3
Metal ion residuals (ICP-OES)* ppm < 1 ppm
Appearance of toluene solution Clear

*No detectable metal elements. Less than 15 ppm P and 50 ppm Si.